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Fb2 Practical surface analysis: By auger and x-ray photoelectron spectroscopy ePub

by D. Briggs,M.P. Seah

Subcategory: Different
Author: D. Briggs,M.P. Seah
ISBN: 047126279X
ISBN13: 978-0471262794
Language: English
Publisher: Wiley (1983)
Pages: 533
Fb2 eBook: 1659 kb
ePub eBook: 1601 kb
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oceedings{A, title {Practical surface analysis: By auger and x-ray photoelectron . Analysis of the surface of different marbles by X-ray photoelectron spectroscopy (XPS) to evaluate decay by SO2 attack

oceedings{A, title {Practical surface analysis: By auger and x-ray photoelectron spectroscopy}, author {David Briggs and Martin P. Seah}, year {1983} }. David Briggs, Martin P. Seah. Analysis of the surface of different marbles by X-ray photoelectron spectroscopy (XPS) to evaluate decay by SO2 attack. Antonio Luque, M. V. Martínez de Yuso, G. Cultrone, Eduardo Sebastián. Environmental Earth Sciences.

Start by marking Practical Surface Analysis, Auger and X-Ray Photoelectron Spectroscopy as Want .

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Briggs: In Practical Surface Analysis by Auger and Photoelectron Spectroscopy ed. by D. Briggs, . Seah (Wiley, New York 1983) Chap. 9, p. 359 and references thereinGoogle Scholar.

John Wiley and Sons Ltd, Chichester, 1983, 533 p. £4. 0. Published: 1 December 1984. Cited by 10 articles.

KEYWORDS: Surface, Interface, Nanocoating, Layered Nanostructures, PVD Growth, AES-EELS Combined Analysis .

KEYWORDS: Surface, Interface, Nanocoating, Layered Nanostructures, PVD Growth, AES-EELS Combined Analysis, Iteration AES Analysis, EELS Depth Profiling, Element and Phase Composition, Atom-Scale Resolution. JOURNAL NAME: Advances in Materials Physics and Chemistry, Vo. N., July 5, 2016.

Customers requiring Xray photoelectron spectroscopy (XPS) or Auger electron spectroscopy (AES) analysis from consultancy laboratories should provide control of substances hazardous to health regulations documentation with their samples. XPS relies upon the emission of electrons from the surface of the sample.

Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS or ESCA) are well-established techniques for surface analysis and also (when combined with sputter depth profiling) for thin film and interface analysis. This book is the first comprehensive treatment of the subject for over 10 years, during which time there have been many advances in instrumentation and performance, understanding of electron spectroscopy fundamentals, experimental methodology and data interpretation, which have markedly enhanced the capabilities of AES and XPS.

Chapter 7. Instrument Calibration for AES and XPS: Martin Seah. Chapter 8. Analyzing Insulators with XPS and AES: Mike Kelly

Surface Analysis by Auger and X-ray Photoelectron Spectroscopy. Published October 2003. Chapter 1. Perspectives on XPS and AES: Dave Briggs & John Grant. Chapter 7. Analyzing Insulators with XPS and AES: Mike Kelly. Chapter 9. Beam Effects During AES and XPS Analysis: Don Baer, Mark Engelhard, Dan Gaspar, and Scott Lea. Surface Sensitivity. Chapter 10. Electron Transport in Solids: Wolfgang Werner.

Bibliographic information.

Practical surface analysis: by auger and x-ray photo-electron spectroscopy. David Briggs, M. P. illustrated, reprint.

X-ray photoelectron spectroscopy. XPS is very effective as a technique for qualitative analysis of elements on a surface and can detect all elements except hydrogen and helium. Since the binding energies of the electrons emitted through XPS are discrete and atoms of different elements have different characteristic electron-binding energies, the emitted electron beam can provide a simple method of elemental analysis. The specificity of XPS is very good, since there is little systematic overlap of spectral lines between elements.

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